Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-ångström emitter localization

Wildanger, Dominik, Patton, Brian R., Schill, Heiko, Marseglia, Luca, Hadden, J. P., Knauer, Sebastian, Schönle, Andreas, Rarity, John G., O'Brien, Jeremy L., Hell, Stefan W. and Smith, Jason M. 2012. Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-ångström emitter localization. Advanced Materials 24 (44) , OP309-OP313. 10.1002/adma.201203033

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Abstract

Exploring the maximum spatial resolution achievable in far‐field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Physics and Astronomy
Publisher:	Wiley-VCH Verlag
ISSN:	0935-9648
Last Modified:	13 Aug 2018 12:50
URI:	http://orca.cf.ac.uk/id/eprint/114119

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