Wildanger, Dominik, Patton, Brian R., Schill, Heiko, Marseglia, Luca, Hadden, J. P., Knauer, Sebastian, Schönle, Andreas, Rarity, John G., O'Brien, Jeremy L., Hell, Stefan W. and Smith, Jason M. 2012. Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-ångström emitter localization. Advanced Materials 24 (44) , OP309-OP313. 10.1002/adma.201203033 |
Official URL: http://dx.doi.org/10.1002/adma.201203033
Abstract
Exploring the maximum spatial resolution achievable in far‐field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
Item Type: | Article |
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Date Type: | Publication |
Status: | Published |
Schools: | Physics and Astronomy |
Publisher: | Wiley-VCH Verlag |
ISSN: | 0935-9648 |
Last Modified: | 13 Aug 2018 12:50 |
URI: | http://orca.cf.ac.uk/id/eprint/114119 |
Citation Data
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