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Photoconductive laser spectroscopy as a method to enhance defect spectral signatures in amorphous oxide semiconductor thin- film transistors

Dhara, Soumen, Niang, Kham M., Flewitt, Andrew J., Nathan, Arokia and Lynch, Stephen A. 2019. Photoconductive laser spectroscopy as a method to enhance defect spectral signatures in amorphous oxide semiconductor thin- film transistors. Applied Physics Letters 114 (1) , 011907. 10.1063/1.5070141

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Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
ISSN: 0003-6951
Date of First Compliant Deposit: 18 December 2018
Date of Acceptance: 18 December 2018
Last Modified: 04 Feb 2020 14:31
URI: http://orca.cf.ac.uk/id/eprint/117765

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