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Selected energy dark-field imaging using low energy electrons for optimal surface phase discrimination

Niu, Y. R., Pereiro Viterbo, Juan, Gomez Sanchez, Daniel and Jesson, D. E. 2019. Selected energy dark-field imaging using low energy electrons for optimal surface phase discrimination. Ultramicroscopy 200 , pp. 79-83. 10.1016/j.ultramic.2019.02.017

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Abstract

We propose a general strategy for surface phase discrimination by dark-field imaging using low energy electrons, which maximizes contrast using diffraction spots, at selected optimal energies. The method can be automated to produce composite phase maps in real space and study the dynamics of complex phase transformations in real-time. To illustrate the capabilities of the technique, surface phases are mapped in the vicinity of liquid Ga droplets on the technologically important GaAs (001) surface.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Publisher: Elsevier
ISSN: 0304-3991
Date of First Compliant Deposit: 20 February 2019
Date of Acceptance: 18 February 2019
Last Modified: 23 Jan 2020 04:11
URI: http://orca.cf.ac.uk/id/eprint/119750

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