Cardiff University | Prifysgol Caerdydd ORCA
Online Research @ Cardiff 
WelshClear Cookie - decide language by browser settings

Recent advances in dual mode charge compensation for XPS analysis

Edwards, Lee, Mack, Paul and Morgan, David J. 2019. Recent advances in dual mode charge compensation for XPS analysis. Surface and Interface Analysis 51 (9) , pp. 925-933. 10.1002/sia.6680

[img]
Preview
PDF - Published Version
Available under License Creative Commons Attribution.

Download (2MB) | Preview

Abstract

Dual mode charge compensation has been used successfully for many years to enable X‐ray photoelectron spectroscopy (XPS) analysis of a variety of insulating samples. This approach uses a combination of low energy electrons and argon to compensate for positive charge build‐up during irradiation by X‐rays. Whilst this method works with no detectable side effects in most cases, it was recently reported that the chemical bonding states of some Cr(VI) oxides may be modified by prolonged exposure to the flood source. In this work, we demonstrate successful dual mode charge compensation of CrO3 with no discernible sample modification from the flood source. Under the same flood source conditions, we extend the analysis to other systems known to undergo reduction and present charge compensated XPS data for V2O5 and a copper‐based metal‐organic framework (MOF) showing little or no modification from the flood source, even with prolonged exposure.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Chemistry
Cardiff Catalysis Institute (CCI)
Publisher: Wiley
ISSN: 0142-2421
Funders: EPSRC and Cogent Power Ltd
Date of First Compliant Deposit: 8 July 2019
Date of Acceptance: 31 May 2019
Last Modified: 11 Sep 2020 09:09
URI: http://orca.cf.ac.uk/id/eprint/124075

Citation Data

Cited 1 time in Scopus. View in Scopus. Powered By Scopus® Data

Actions (repository staff only)

Edit Item Edit Item

Downloads

Downloads per month over past year

View more statistics