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An ontology framework for pile integrity evaluation based on analytical methodology

Meng, Kun, Cui, Chunyi and Li, Haijiang 2020. An ontology framework for pile integrity evaluation based on analytical methodology. IEEE Access 8 , pp. 72158-72168. 10.1109/ACCESS.2020.2986229

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Abstract

Traditional methodology for pile integrity evaluation usually adopts fuzzy qualitative indicators and the engineering experience of technicians to roughly estimate the integrity category of a pile, which includes many uncertainties and heavily subjective factors. Therefore, based on an analytical model for the vibration of pile and an ontology-based approach, this paper describes the development of an integrated evaluation system that can make reasonable evaluations of pile integrity where specific measured reflective wave curves are provided. First, a semi-analytical solution for the velocity response of pile with defects at the pile head was derived by analytical methodology, and then the intrinsic relationships between the quantitative indicators of pile defects and the characteristic parameters of velocity response curves were obtained according to the propagation law of elastic wave and the numerical fitting method. On this basis, a prototypical ontology-based evaluation system, ontology of pile integrity evaluation (OntoPIE), with a new ontology framework of leverage knowledge modelling was developed to create an easy-to-use tool for quantitative identification of pile defects and qualitative evaluation of pile integrity by combining ontology and semantic web rule language (SWRL) rules. A case study was also conducted to show how the developed framework can be used to demonstrate its practicability and scientific feasibility. The accuracy of the framework will be verified by comparing the quantitative indicators of pile defects inferred by OntoPIE with the preset defect indicators through designed examples.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Engineering
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
ISSN: 2169-3536
Date of First Compliant Deposit: 9 April 2020
Date of Acceptance: 3 April 2020
Last Modified: 10 Jun 2020 12:55
URI: http://orca.cf.ac.uk/id/eprint/130912

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