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X-Ray Birefringence Imaging (XBI): a new technique for spatially resolved mapping of molecular orientations in materials

Harris, Kenneth D. M., Patterson, Rhian, Zhou, Yating and Collins, Stephen P. 2020. X-Ray Birefringence Imaging (XBI): a new technique for spatially resolved mapping of molecular orientations in materials. In: Sakamoto, Masami and Uekusa, Hidehiro eds. Advances in Organic Crystal Chemistry: Comprehensive Reviews 2020, Springer, Singapore, pp. 3-27. (10.1007/978-981-15-5085-0_1)

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Abstract

The X-ray birefringence imaging (XBI) technique, first reported in 2014, is a sensitive method for spatially resolved mapping of the local orientational properties of anisotropic materials. In the case of organic materials, the technique may be applied to study the orientational properties of individual molecules and/or bonds, including the study of changes in molecular orientations associated with order–disorder phase transitions and characterization of phase transitions in liquid crystalline materials. This chapter presents a basic introduction to the XBI technique, giving a qualitative description of the fundamentals of the technique and discussing experimental aspects of the measurement of XBI data. Several examples are presented to highlight the application of the technique to study the orientational properties of molecules in organic materials.

Item Type: Book Section
Date Type: Published Online
Status: Published
Schools: Chemistry
Publisher: Springer, Singapore
ISBN: 9789811550843
Last Modified: 15 Jul 2020 14:00
URI: http://orca.cf.ac.uk/id/eprint/133393

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