Investigation of a new process chain based on atomic force microscopy scratching

Brousseau, Emmanuel Bruno Jean Paul, Krohs, F., Dimov, Stefan Simeonov, Griffiths, C. A., Scholz, S. G., Rees, A. and Fatikow, S. 2009. Investigation of a new process chain based on atomic force microscopy scratching. Presented at: Fifth International Conference on Multi-Material Micro Manufacture, 4M2009, Karlsruhe, Germany, pp. 267-270.

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Item Type:	Conference or Workshop Item (Paper)
Schools:	Engineering Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC)
Last Modified:	04 Jun 2017 03:23
URI:	http://orca.cf.ac.uk/id/eprint/20777

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