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An active, non-intrusive, high resolution microwave field probe with applications in high power RF device and circuit design

Cripps, Stephen Charles and Porch, Adrian 2010. An active, non-intrusive, high resolution microwave field probe with applications in high power RF device and circuit design. Presented at: 2010 IEEE 11th Annual Wireless and Microwave Technology Conference (WAMICON 2010), Melbourne Beach, USA, , vol. 546185.

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Item Type: Conference or Workshop Item (Paper)
Schools: Engineering
Last Modified: 04 Jun 2017 03:24
URI: http://orca.cf.ac.uk/id/eprint/20856

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