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A methodology for technology maturity assessment of micro and nano manufacturing processes and process chains

Vella, P. C., Brousseau, Emmanuel Bruno Jean Paul, Minev, R. and Dimov, Stefan Simeonov 2010. A methodology for technology maturity assessment of micro and nano manufacturing processes and process chains. Presented at: 5th International Conference on Micro Manufacturing (ICOMM/4M2010), Madison, USA, pp. 327-334.

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Item Type: Conference or Workshop Item (Paper)
Schools: Engineering
Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC)
Last Modified: 04 Jun 2017 03:27
URI: http://orca.cf.ac.uk/id/eprint/21457

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