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Measurement of optical gain and Fermi level separation in semiconductor structures

Thomson, John Duncan, Summers, Huw David, Hulyer, Paul J., Smowton, Peter Michael and Blood, Peter 2000. Measurement of optical gain and Fermi level separation in semiconductor structures. Presented at: Physics and Simulation of Optoelectronic Devices VIII, San Jose, CA, USA, 24-28 January 2000. Published in: Binder, R. H., Blood, Peter and Osinski, M. eds. Physics and Simulation of Optoelectronic Devices VIII. Proceedings of SPIE , vol. 3944. Bellingham, WA: SPIE, pp. 201-208. 10.1117/12.391422

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Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Additional Information: Proceedings of the conference held in San Jose, CA, USA, 24 January 2000
Publisher: SPIE
Related URLs:
Last Modified: 10 Oct 2017 14:24
URI: http://orca.cf.ac.uk/id/eprint/30923

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Cited 3 times in Web of Science. View in Web of Science.

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