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Scanning probe microscopy of semiconductor quantum dots

Everson, Richard 2012. Scanning probe microscopy of semiconductor quantum dots. MPhil Thesis, Cardiff University.
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Abstract

The purpose of this study was to design and construct a microscope combining scanning probe and optical microscopy techniques. The microscope is intended for the study of the fluorescence intermittency effect in quantum dots. This microscope has been realised, using quartz tuning forks as the force sensor. Two different techniques for preparing these tuning fork sensors for scanning probe microscopy have been developed, with a quality factor of roughly 104. The microscope operates in high vacuum. Various components have been designed and constructed for this microscope, including positioning devices allowing for the positioning of scanning probe and optical microscopes on the same region of a sample. A time-correlated single photon counting technique has been employed for the optical microscopy part of the microscope.

Item Type: Thesis (MPhil)
Status: Unpublished
Schools: Physics and Astronomy
Subjects: Q Science > QA Mathematics
Q Science > QC Physics
Uncontrolled Keywords: atomic force microscopy ; optical microscopy ; scanning probe microscopy ; quantum dot ; blinking effect ; fluorescence intermittancy ; quartz tuning fork ; phase locked loop
Funders: EPSRC
Date of First Compliant Deposit: 30 March 2016
Last Modified: 20 Mar 2016 22:53
URI: http://orca.cf.ac.uk/id/eprint/35839

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