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RF Waveform Measurement and Engineering

Tasker, Paul J. 2009. RF Waveform Measurement and Engineering. Presented at: Annual IEEE Compound Semiconductor Integrated Circuit Symposium, 2009. CISC 2009, Greensboro, NC, USA, 11-14 October 2009. Integrated Circuits in GaAs, InP, SiGe, GaN, and Other Compound Semiconductors - Proceedings of the Annual IEEE Compound Semiconductor Integrated Circuit Symposium, 2009. CISC 2009. Los Alamitos, CA: IEEE, 10.1109/csics.2009.5315818

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Abstract

RF I-V waveform measurement and engineering systems are finally enabling practical waveform engineering to be directly undertaken within the RF power amplifier (RFPA) design cycle. RFPAs are a critical component in many systems; e.g. mobile communications, satellite communications and radar systems.

Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Engineering
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Publisher: IEEE
ISBN: 9781424451913
Last Modified: 04 Jun 2017 04:18
URI: http://orca.cf.ac.uk/id/eprint/36320

Citation Data

Cited 3 times in Scopus. View in Scopus. Powered By Scopus® Data

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