| Childerhouse, P., Disney, Stephen Michael and Naim, Mohamed Mohamed 1999. A quick scan method for supply chain diagnostic. Presented at: 4th International Symposium on Logistics, Florence, Italy, 11-14 July 1999. Published in: Muffatto, Moreno and Pawar, Kulwant eds. Proceedings of the 4th International Symposium on Logistics: Logistics in the Information Age, Florence, Italy, 11-14 July 1999. Padova: SGE, pp. 761-775. |
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Date Type: | Publication |
| Status: | Published |
| Schools: | Business (Including Economics) Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC) |
| Publisher: | SGE |
| ISBN: | 9788886281379 |
| Last Modified: | 04 Jun 2017 04:29 |
| URI: | http://orca.cf.ac.uk/id/eprint/39973 |
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