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X-ray diffraction study of the structure of thin polyfluorene films

Kawana, S., Durrell, M., Lu, J., Macdonald, John Emyr, Grell, M., Bradley, D. D. C., Jukes, P. C., Jones, R. A. L. and Bennett, S. L. 2002. X-ray diffraction study of the structure of thin polyfluorene films. Polymer 43 (6) , pp. 1907-1913. 10.1016/S0032-3861(01)00753-4

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Abstract

The molecular arrangement in thin films of poly(9,9-dioctylfluorene) and poly(9,9-dihexylfluorene) deposited on silicon substrates has been investigated with grazing incidence X-ray diffraction. In particular, the effect of the interface on the molecular orientation is highlighted. Both materials display a periodicity normal to the surface arising from stacked sheets of fluorene chains in both the crystalline and liquid crystalline phases. For the crystalline phase, a periodicity in the plane of the surface of 4.15 Å is observed corresponding to half the fluorene ring repeat distance along the backbone, consistent with interdigitating side-chains. For crystalline films deposited onto rubbed polyimide films, strong orientation effects are observed. In the liquid-crystalline phase, this strong in-plane ordering of backbones is lost. Poly(9,9-dihexylfluorene) exhibits an additional degree of ordering in the plane of the interface, which is likely to arise from hexagonal ordering of the backbone chains.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Uncontrolled Keywords: Polyfluorene; Grazing incidence X-ray diffraction;Thin films
Publisher: Elsevier
ISSN: 0032-3861
Last Modified: 04 Jun 2017 04:52
URI: http://orca.cf.ac.uk/id/eprint/45812

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