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Low-temperature growth of thin Pb layers and the quantum size effect

Schmicker, D., Hibma, T., Edwards, K. A., Howes, P. B., MacDonald, John Emyr, James, M. A., Breeman, M. and Barkema, G. T. 1997. Low-temperature growth of thin Pb layers and the quantum size effect. Journal of Physics: Condensed Matter 9 (5) , 969. 10.1088/0953-8984/9/5/004

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Abstract

It is argued that the growth morphology of ultrathin metal films should fluctuate as a function of film thickness due to the quantum size effect. To verify this, the specularly reflected intensity of x-rays, electrons and He atoms has been measured during the growth of a thin Pb layer on top of an substrate at 100 K. Curiously enough, the expected variation is observed in the He atom and electron scattering data, but not in the x-ray reflectivity. Our explanation is that the differences in the heat of formation for successive atomic layers have a strong effect on the step density, but not on the occupancy of the layers at the low growth temperatures necessary to obtain layer-by-layer growth. This is backed up by the results of a Monte Carlo simulation.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Uncontrolled Keywords: surfaces; interfaces; thin films
Publisher: IOP Publishing
ISSN: 0953-8984
Last Modified: 04 Jun 2017 04:52
URI: http://orca.cf.ac.uk/id/eprint/45956

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Cited 15 times in Web of Science. View in Web of Science.

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