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The structure of Si(111)-()R30°-Ag determined by surface X-ray diffraction

Vlieg, E., Van Der Gon, A. W. Denier, Van Der Veen, J. F., MacDonald, John Emyr and Norris, C. 1989. The structure of Si(111)-()R30°-Ag determined by surface X-ray diffraction. Surface Science 209 (1-2) , pp. 100-114. 10.1016/0039-6028(89)90061-7

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Abstract

The Ag-induced (√3 × √3)R30° reconstruction on Si(111) has been investigated by surface X-ray diffraction. The in-plane projected structure is found from the structure factors near zero perpendicular momentum transfer. The height of the atoms in the unit cell is determined from rod profiles. The unit cell contains three Ag atoms (saturation coverage 1 monolayer) and eight Si atoms. The Ag atoms are located below a top layer of Si atoms that form a honeycomb. Large displacements from bulk positions occur. The structure is discussed in comparison with other measurements and previously proposed models.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Publisher: Elsevier
ISSN: 0039-6028
Last Modified: 04 Jun 2017 04:53
URI: http://orca.cf.ac.uk/id/eprint/46150

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