Mexis, Meletios, Blood, Peter and Smowton, Peter Michael 2007. Polarization response of quantum-confined structures using edge-photovoltage spectroscopy. Semiconductor Science and Technology 22 (12) , pp. 1298-1301. 10.1088/0268-1242/22/12/010 |
Official URL: http://dx.doi.org/10.1088/0268-1242/22/12/010
Abstract
We propose a method to obtain the ratio of the fundamental TE/TM optical response of a quantum-confined system from the measurement of the polarization dependence of the edge photovoltage spectrum by correcting for polarization-dependent features of the experimental system. When applied to compressive- and tensile-strained InGaP quantum well structures, the results are in excellent agreement with known ratios of the band-edge matrix elements. The method will be of a particular value in the study of quantum dot systems.
Item Type: | Article |
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Date Type: | Publication |
Status: | Published |
Schools: | Physics and Astronomy |
Subjects: | Q Science > QC Physics |
Publisher: | Institute of Physics |
ISSN: | 0268-1242 |
Last Modified: | 04 Jun 2017 05:45 |
URI: | http://orca.cf.ac.uk/id/eprint/53207 |
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