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Polarization response of quantum-confined structures using edge-photovoltage spectroscopy

Mexis, Meletios, Blood, Peter and Smowton, Peter Michael 2007. Polarization response of quantum-confined structures using edge-photovoltage spectroscopy. Semiconductor Science and Technology 22 (12) , pp. 1298-1301. 10.1088/0268-1242/22/12/010

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Abstract

We propose a method to obtain the ratio of the fundamental TE/TM optical response of a quantum-confined system from the measurement of the polarization dependence of the edge photovoltage spectrum by correcting for polarization-dependent features of the experimental system. When applied to compressive- and tensile-strained InGaP quantum well structures, the results are in excellent agreement with known ratios of the band-edge matrix elements. The method will be of a particular value in the study of quantum dot systems.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Publisher: Institute of Physics
ISSN: 0268-1242
Last Modified: 04 Jun 2017 05:45
URI: http://orca.cf.ac.uk/id/eprint/53207

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