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EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative

Lilliu, Samuele, Maragliano, C., Hampton, Mark David, Elliott, Martin, Stefancich, M., Chiesa, M., Dahlem, M. S. and MacDonald, John Emyr 2013. EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative. Scientific Reports 3 , 3352. 10.1038/srep03352

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Abstract

We report a simple technique for mapping Electrostatic Force Microscopy (EFM) bias sweep data into 2D images. The method allows simultaneous probing, in the same scanning area, of the contact potential difference and the second derivative of the capacitance between tip and sample, along with the height information. The only required equipment consists of a microscope with lift-mode EFM capable of phase shift detection. We designate this approach as Scanning Probe Potential Electrostatic Force Microscopy (SPP-EFM). An open-source MATLAB Graphical User Interface (GUI) for images acquisition, processing and analysis has been developed. The technique is tested with Indium Tin Oxide (ITO) and with poly(3-hexylthiophene) (P3HT) nanowires for organic transistor applications.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QA Mathematics > QA75 Electronic computers. Computer science
Q Science > QC Physics
Publisher: Nature Publishing Group
ISSN: 2045-2322
Date of First Compliant Deposit: 30 March 2016
Last Modified: 10 Oct 2017 15:33
URI: http://orca.cf.ac.uk/id/eprint/57452

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Cited 4 times in Web of Science. View in Web of Science.

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