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Spectral speckle analysis: a new method to measure coherence and dephasing in semiconductor nanostructures

Alferov, Zhores I., Kocherscheidt, G., Langbein, Wolfgang Werner, Zimmermann, Roland and Esaki, Leo 2002. Spectral speckle analysis: a new method to measure coherence and dephasing in semiconductor nanostructures. Presented at: 10th International Symposium on Nanostructures: Physics and Technology, St. Petersburg, Russia, 17-21 June 2002. Published in: Alferov, Zhores I. and Esaki, Leo eds. 10th International Symposium on Nanostructures: Physics and Technology (Proceedings of Spie). , vol. 5023. Bellingham, WA: The International Society for Optical Engineering, 10.1117/12.513755

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Abstract

A new method to measure the coherence of inhomogeneously broadened optical excitations in semiconductor nanostructures is presented. The secondary emission of excitons in semiconductor quantum wells is investigated. The spectrally-resolved coherence degree of resonantly-excited light emission is deduced from the intensity fluctuations over the emission directions (speckles). The spectral correlations of the speckles give direct access to the homogeneous line width as function of spectral position within the inhomogeneously broadened ensemble. The combination of static disorder and phonon scattering leads to a partially coherent emission. The temperature dependence of the homogeneous line width is well explained by phonon scattering.

Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Uncontrolled Keywords: Nanostructures ; Semiconductors ; Speckle analysis ; Speckle ; Phonons ; Scattering ; Excitons ; Quantum wells
Publisher: The International Society for Optical Engineering
ISBN: 0819448249
ISSN: 0277-786X
Related URLs:
Last Modified: 04 Jun 2017 08:00
URI: http://orca.cf.ac.uk/id/eprint/71405

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