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Self-assembled organic nanowires: a structural and electronic study

Simmonds, Henje Samuel, Bennett, Neil, Elliott, Martin and Macdonald, John Emyr 2009. Self-assembled organic nanowires: a structural and electronic study. Journal of Vacuum Science and Technology. B, Nanotechnology and Microelectronics : Materials, Processing, Measurement, and Phenomena 27 (2) , 831. 10.1116/1.3054198

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Abstract

The organic conjugated polymer poly (3,3″ ′-didodecyl quarter thiophene) dissolves well in chloroform and produces a uniform film when spin cast onto an oxidized Si surface. However, the authors have determined using atomic force microscopy that when toluene is used as the solvent, the same procedure yields electrically conductive nanowires which are 5 nm high, ≥ 20 nm wide, and several microns long. Similar wires were observed after spin or drop casting the solution on Au, highly oriented pyrolitic graphite, mica, or SiO2, implying that the wires form in solution rather than during the deposition process. After the wires were deposited from solution and dried, a film which is also deposited from solution could be removed effectively without disturbing the wires by subsequent rinsing with toluene. Electrostatic force microscopy was used to study the electrical properties of the wires with 30 nm resolution after spin or drop casting them across 10 μm wide gaps between metal contacts deposited on the Si oxide surface. With current passed between the contacts, the voltage dropped at the wire-contact interface was seen to be important, indicating a large contact resistance, but the voltage dropped at the junction of two wires was found to be very low.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Uncontrolled Keywords: Atomic force microscopy ; Casting ; conducting polymers ; Contact resistance ; Dissolving ; Nanowires ; Self-assembly
Publisher: American Institute of Physics
ISSN: 1071-1023
Last Modified: 04 Jun 2017 01:59
URI: http://orca.cf.ac.uk/id/eprint/7281

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