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Angle calculations for a five-circle diffractometer used for surface X-ray diffraction

Vlieg, E., Van der Veen, J. F., MacDonald, John Emyr and Miller, M. 1987. Angle calculations for a five-circle diffractometer used for surface X-ray diffraction. Journal of Applied Crystallography 20 (5) , pp. 330-337. 10.1107/S0021889887086527

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Abstract

The basic equations are derived for the calculation of the angle settings of a five-circle diffractometer used for surface X-ray diffraction. This is done for a specified angle of incidence. An additional constraint that may be imposed is the horizontal alignment of the diffraction rods to match the divergence of the synchrotron X-ray source or the horizontal setting of the physical surface normal. Alignment procedures and the derivation of the orientation matrix are discussed.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Publisher: International Union of Crystallography
ISSN: 0021-8898
Last Modified: 04 Jun 2017 08:21
URI: http://orca.cf.ac.uk/id/eprint/76450

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Cited 43 times in Web of Science. View in Web of Science.

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