Comparison of two AFM probe inspection techniques for three-dimensional tip characterisation

Alraziqi, Zaynab, Mukhtar, Nur Farah Hafizah and Brousseau, Emmanuel Bruno Jean-Paul 2016. Comparison of two AFM probe inspection techniques for three-dimensional tip characterisation. Presented at: EUSPEN: 16th International Conference & Exhibition, Nottingham, UK, 30 May - 3 June 2016. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology. EUSPEN,

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Item Type:	Conference or Workshop Item (Poster)
Status:	In Press
Schools:	Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC) Engineering
Subjects:	T Technology > TS Manufactures
Publisher:	EUSPEN
ISBN:	9780956679086
Last Modified:	24 May 2019 20:36
URI:	http://orca.cf.ac.uk/id/eprint/91524

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