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Processing outcomes of the AFM probe-based machining approach with different feed directions

Geng, Yanquan, Yan, Yongda, Brousseau, Emmanuel Bruno Jean Paul, Yu, Bowen, Qu, Shengnan, Hu, Zhenjiang and Zhao, Xuesen 2016. Processing outcomes of the AFM probe-based machining approach with different feed directions. Precision Engineering 46 , pp. 288-300. 10.1016/j.precisioneng.2016.05.009

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Abstract

We present experimental and theoretical results to describe and explain processing outcomes when producing nanochannels that are a few times wider than the atomic force microscope (AFM) probe using an AFM. This is achieved when AFM tip-based machining is performed with reciprocating motion of the tip of the AFM probe. In this case, different feed directions with respect to the orientation of the AFM probe can be used. The machining outputs of interest are the chip formation process, obtained machined quality, and variation in the achieved channel depth. A three-sided pyramidal diamond probe was used under load-controlled conditions. Three feed directions were first investigated in detail. The direction parallel to and towards the probe cantilever, which is defined as “edge forward”, was then chosen for further investigation because it resulted in the best chip formation, machining quality, and material removal efficiency. To accurately reveal the machining mechanisms, several feed directions with different included angles for the pure edge-forward direction were investigated. Upon analysis of the chips and the machined nanochannels, it was found that processing with included angles in the range 0–30° led to high-quality channels and high material-removal efficiency. In this case, the cutting angles, such as the rake angle, clearance angle, and shear angle, have an important influence on the obtained results. In addition, a machining model was developed to explain the observed machined depth variation when scratching in different feed directions.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC)
Engineering
Subjects: T Technology > TS Manufactures
Uncontrolled Keywords: Atomic force microscopy; Tip-based machining; Feed direction; Three-sided pyramidal probe; Chip formation; Machined depth
Publisher: Elsevier
ISSN: 0141-6359
Date of First Compliant Deposit: 23 June 2016
Date of Acceptance: 21 May 2016
Last Modified: 27 Jun 2019 07:17
URI: http://orca.cf.ac.uk/id/eprint/92058

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