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Number of items: 3.

Thomas, Huw Ellis 2010. Structure determination of thin polymer films using GIXRd and AFM. PhD Thesis, Cardiff University.
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Droge, Stefan, Al Khalifah, Manea S., O'Neill, Mary, Thomas, Huw Ellis, Simmonds, Henje Samuel, Macdonald, John Emyr, Aldred, Matthew P., Vlachos, Panos, Kitney, Stuart P., Lobbert, Andreas and Kelly, Stephen M. 2009. Grazing Incidence X-ray Diffraction of a Photoaligned Nematic Semiconductor. Journal of Physical Chemistry B 113 (1) , pp. 49-53. 10.1021/jp803379a

Das, Arindam, Lei, C. H., Thomas, Huw E., Elliott, Martin, Macdonald, John Emyr, Glarvey, P. and Turner, M. L. 2006. EFM Phase Investigation of the Metal-Organic Film Interface. Applied Surface Science 252 (15) , pp. 5477-5480. 10.1016/j.apsusc.2005.12.091

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