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Number of items: 3.

Thomas, Huw Ellis 2010. Structure determination of thin polymer films using GIXRd and AFM. PhD Thesis, Cardiff University.

Droge, Stefan, Al Khalifah, Manea S., O'Neill, Mary, Thomas, Huw Ellis, Simmonds, Henje Samuel, Macdonald, John Emyr, Aldred, Matthew P., Vlachos, Panos, Kitney, Stuart P., Lobbert, Andreas and Kelly, Stephen M. 2009. Grazing Incidence X-ray Diffraction of a Photoaligned Nematic Semiconductor. Journal of Physical Chemistry B 113 (1) , pp. 49-53. 10.1021/jp803379a

Das, Arindam, Lei, C. H., Thomas, Huw E., Elliott, Martin, Macdonald, John Emyr, Glarvey, P. and Turner, M. L. 2006. EFM Phase Investigation of the Metal-Organic Film Interface. Applied Surface Science 252 (15) , pp. 5477-5480. 10.1016/j.apsusc.2005.12.091

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