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Number of items: 5.

Almuhaisen, Abdullah 2012. A novel approach for wide band high-efficiency power amplifier design. PhD Thesis, Cardiff University.
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Canning, Timothy A. J., Almuhaisen, Abdullah, Lees, Jonathan, Benedikt, Johannes, Cripps, Stephen Charles and Tasker, Paul J. 2011. Utilization of RF I-V waveform load-pull information to identify the role FET knee profile has on locating the efficiency maxima. Presented at: 2011 78th ARFTG Microwave Measurement Symposium (ARFTG), Tempe, AZ, USA, 1-2 December 2011. Proceedings of the 2011 78th ARFTG Microwave Measurement Symposium (ARFTG) - High Power RF Measurement Techniques. Los Alamitos, CA: IEEE, 10.1109/ARFTG78.2011.6183864

Almuhaisen, Abdullah, Lees, Jonathan, Cripps, Stephen Charles, Tasker, Paul J. and Benedikt, Johannes 2011. Wide band high-efficiency power amplifier design. Presented at: 6th European Microwave Integrated Circuits Conference (EuMIC) 2011, Manchester, UK, 10-11 October 2011. Proceedings of the 6th European Microwave Integrated Circuits Conference (EuMIC). Los Alamitos, CA: IEEE, pp. 184-187.

Carrubba, Vincenzo, Clarke, Alan Leslie, Woodington, Simon P., McGenn, William, Akmal, Muhammad, Almuhaisen, Abdullah, Lees, Jonathan, Cripps, Stephen Charles, Tasker, Paul J. and Benedikt, Johannes 2011. High-speed device characterization using an active load-pull system and waveform engineering postulator. Presented at: 2011 77th ARFTG Microwave Measurement Conference (ARFTG), Baltimore, MD, USA, 10 June 2011. Design and Measurement of Microwave Systems - Proceedings of the 2011 77th ARFTG Microwave Measurement Conference (ARFTG). Los Alamitos, CA: IEEE, 10.1109/ARFTG77.2011.6034553

Almuhaisen, Abdullah, Wright, Peter Thomas, Lees, Jonathan, Tasker, Paul J., Cripps, Stephen Charles and Benedikt, Johannes 2010. Novel wide band high-efficiency active harmonic injection power amplifier concept. Presented at: IEEE MTT-S International Microwave Symposium, Anaheim, CA, USA, 23-28 May 2010. 2010 IEEE MTT-S International Microwave Symposium Digest (MTT 2010). New York: IEEE, pp. 664-667. 10.1109/MWSYM.2010.5514759

This list was generated on Thu Nov 21 09:46:20 2019 GMT.