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Mukhtar, Nur Farah Hafizah 2017. Characterisation of tip wear during AFM probe-based nanomachining. PhD Thesis, Cardiff University.
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Alraziqi, Zaynab, Mukhtar, Nur Farah Hafizah and Brousseau, Emmanuel Bruno Jean-Paul 2016. Comparison of two AFM probe inspection techniques for three-dimensional tip characterisation. Presented at: EUSPEN: 16th International Conference & Exhibition, Nottingham, UK, 30 May - 3 June 2016. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology. EUSPEN,

Alraziqi, Zaynab, Mukhtar, Nur Farah Hafizah and Brousseau, Emmanuel 2016. Comparison of two AFM probe inspection techniques for three-dimensional tip characterization. Presented at: 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016, University of Nottingham, Nottingham, United Kingdom, 30 May - 3 June 2016. Published in: Bointon, P., Leach, Ronald K. and Southon, N. eds. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016. Cranfield, Bedfordshire, UK: euspen, pp. 639-646.

Mukhtar, Nur Farah Hafizah, Brousseau, Emmanuel Bruno Jean Paul and Prickett, Paul William 2014. Study of silicon tip wear during AFM probe-based machining of single crystal copper. Presented at: Ninth International Conference on MicroManufacturing (ICOMM 2014), Nanyang Technological University (NTU) and National University of Singapore (NUS), Singapore, 25-28 March 2014.

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