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Up a levelNumber of items: 4.
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Mukhtar, Nur Farah Hafizah
2017.
Characterisation of tip wear during AFM probe-based nanomachining.
PhD Thesis,
Cardiff University.
Item availability restricted. |
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Alraziqi, Zaynab, Mukhtar, Nur Farah Hafizah and Brousseau, Emmanuel  ORCID: https://orcid.org/0000-0003-2728-3189
2016.
Comparison of two AFM probe inspection techniques for three-dimensional tip characterization.
Presented at: 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016,
University of Nottingham, Nottingham, United Kingdom,
30 May - 3 June 2016.
Published in: Bointon, P., Leach, Ronald K. and Southon, N. eds.
Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016.
Cranfield, Bedfordshire, UK:
euspen,
pp. 639-646.
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Alraziqi, Zaynab, Mukhtar, Nur Farah Hafizah and Brousseau, Emmanuel Bruno Jean-Paul ORCID: https://orcid.org/0000-0003-2728-3189
2016.
Comparison of two AFM probe inspection techniques for three-dimensional tip characterisation.
Presented at: EUSPEN: 16th International Conference & Exhibition,
Nottingham, UK,
30 May - 3 June 2016.
Published in: Bointon, P., Leach, R. and Southon, N. eds.
Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology.
Bedford:
EUSPEN,
pp. 59-60.
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Mukhtar, Nur Farah Hafizah, Brousseau, Emmanuel Bruno Jean Paul ORCID: https://orcid.org/0000-0003-2728-3189 and Prickett, Paul William ORCID: https://orcid.org/0000-0001-8985-7278
2014.
Study of silicon tip wear during AFM probe-based machining of single crystal copper.
Presented at: Ninth International Conference on MicroManufacturing (ICOMM 2014),
Nanyang Technological University (NTU) and National University of Singapore (NUS), Singapore,
25-28 March 2014.
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