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Number of items: 4.

Mukhtar, Nur Farah Hafizah 2017. Characterisation of tip wear during AFM probe-based nanomachining. PhD Thesis, Cardiff University.
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Alraziqi, Zaynab, Mukhtar, Nur Farah Hafizah and Brousseau, Emmanuel 2016. Comparison of two AFM probe inspection techniques for three-dimensional tip characterization. Presented at: 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016, University of Nottingham, Nottingham, United Kingdom, 30 May - 3 June 2016. Published in: Bointon, P., Leach, Ronald K. and Southon, N. eds. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016. Cranfield, Bedfordshire, UK: euspen, pp. 639-646.

Alraziqi, Zaynab, Mukhtar, Nur Farah Hafizah and Brousseau, Emmanuel Bruno Jean-Paul 2016. Comparison of two AFM probe inspection techniques for three-dimensional tip characterisation. Presented at: EUSPEN: 16th International Conference & Exhibition, Nottingham, UK, 30 May - 3 June 2016. Published in: Bointon, P., Leach, R. and Southon, N. eds. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology. Bedford: EUSPEN, pp. 59-60.

Mukhtar, Nur Farah Hafizah, Brousseau, Emmanuel Bruno Jean Paul and Prickett, Paul William 2014. Study of silicon tip wear during AFM probe-based machining of single crystal copper. Presented at: Ninth International Conference on MicroManufacturing (ICOMM 2014), Nanyang Technological University (NTU) and National University of Singapore (NUS), Singapore, 25-28 March 2014.

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