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Speckle analysis of resonant secondary emission

Langbein, Wolfgang Werner 2002. Speckle analysis of resonant secondary emission. physica status solidi (b) 234 (1) , pp. 84-95. 10.1002/1521-3951(200211)234:1<84::AID-PSSB84>3.0.CO;2-Y

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The technique of the speckle analysis of resonant secondary emission is reviewed. It is a novel, linear optical technique to measure the microscopic intensity and polarization dynamics in inhomogeneously broadened ensembles, that represents an alternative for established non-linear optical techniques such as photon-echo or spectral hole burning. Both time-resolved and spectrally resolved variants of the speckle analysis are discussed. Experimental results obtained on semiconductor quantum wells using both techniques are presented.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Publisher: Wiley
ISSN: 1521-3951
Last Modified: 04 Jun 2017 08:00

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